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Forward voltage testing involves measuring the voltage drop across a diode or semiconductor junction in a cable when a forward-bias current is applied. An increase in forward voltage drop may be an indicator of an electrical component that is soon to fail.
The voltage drop across the test specimen may be calculated by three methods: the DC method using a variable voltage source, the pulse method using an oscilloscope and pulse generator, or the curve tracer method.
Parameters that may be adjusted include:
- Test current
- Forward voltage
- Duty cycle and pulse width (if pulse method is used)