Dust
FOR: EWIS Components Operating in Dust-Laden Environment $8,500The dust test evaluates an electronic component's ability to endure an atmosphere laden with dry dust. A component sample is placed in a chamber where circulating fans move the dust laden air at a specified speed.
The component under test is subject to a series of exposures between which the air speed, humidity, and temperature are varied. The test sample is evaluated on its ability to operate after enduring the exposures.
Covered specifications
- MIL-DTL-38999 Method 4.5.41
- MIL-STD-202-110
- MIL-STD-810 Method 510.7